The Department of Energy is seeking bids for a Milli-Kelvin Scanning Probe Microscope (mK-SPM). The instrument must operate tuning-fork-based atomic force microscopy (TFAFM) and support scanning Microwave Impedance Microscopy (sMIM).
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Item
Qty
Unit
Est. Unit Price
Est. Total
Category
Milli-Kelvin Scanning Probe Microscope
1
each
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Scientific Equipment
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